ISO 17470:2004

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Publication date: 13 sht 2004

95.99 Withdrawal of Standard 6 jan 2014

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Current stage: 95.99 Effective date: 6 jan 2014

Originator: ISO

Owner: ISO/TC 202/SC 2

Type: International Standard

ICS: 71.040.99

Gjuha: anglisht frëngjisht

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ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

ISO 17470:2004

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

95.99 Withdrawal of Standard 6 jan 2014

General information

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