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ISO 15932:2013

Microbeam analysis — Analytical electron microscopy — Vocabulary
13 dhj 2013

General information

90.60     4 qer 2024

ISO

ISO/TC 202/SC 1

International Standard

37.020     01.040.37  

anglisht   frëngjisht  

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Scope

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

Life cycle

NOW

PUBLISHED
ISO 15932:2013
90.60 Close of review
4 qer 2024

National adoptions

SSH ISO 15932:2013  
DPS

Analiza mikrobiale - Mikroskop elektronik analitik - Fjalori

60.60 Standard published

DPS/KT 233 më tepër