Shfuqizuar
ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
WITHDRAWN
ISO 18116:2005
95.99
Withdrawal of Standard
18 shk 2025
PUBLISHED
ISO 20579-2:2025