IEC 61163-1:1995 ED1

Reliability stress screening - Part 1: Repairable items manufactured in lots

Publication date: 14 gush 1995

General information

Current stage: 99.60 Effective date: 26 qer 2006

Originator: IEC

Owner: TC 56

Type: International Standard

ICS: 03.120.01 03.120.30 21.020

Gjuha: anglisht frëngjisht spanjisht

Buying

Statusi: Revised

PDF - 41 271 Lekë

Paper - 41 271 Lekë

CD - 41 271 Lekë

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Scope

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Life cycle

NOW

WITHDRAWN
IEC 61163-1:1995 ED1
99.60 Withdrawal effective
26 qer 2006

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 61163-1:1995/COR1:1999 ED1

REVISED BY

PUBLISHED
IEC 61163-1:2006 ED2