IEC 61163-1:1995 ED1

Reliability stress screening - Part 1: Repairable items manufactured in lots

Publication date: Aug 14, 1995

General information

Current stage: 99.60 Effective date: Jun 26, 2006

Originator: IEC

Owner: TC 56

Type: International Standard

ICS: 03.120.01 03.120.30 21.020

Languages: English French Spanish

Buying

Status: Revised

PDF - ALL 41,271

Paper - ALL 41,271

CD - ALL 41,271

Language

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Scope

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Life cycle

NOW

WITHDRAWN
IEC 61163-1:1995 ED1
99.60 Withdrawal effective
Jun 26, 2006

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 61163-1:1995/COR1:1999 ED1

REVISED BY

PUBLISHED
IEC 61163-1:2006 ED2