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IEC 60749:1984/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.
20 dhj 1991

General information

99.60     28 tet 1996

IEC

TC 47

International Standard

31.080.01  

anglisht   frëngjisht  

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Revised

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Scope

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1984 ED1

NOW

WITHDRAWN
IEC 60749:1984/AMD1:1991 ED1
99.60 Withdrawal effective
28 tet 1996

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2