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IEC 60749:1984/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.

Dec 20, 1991

General information

99.60     Oct 28, 1996

IEC

TC 47

International Standard

31.080.01  

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IEC 60749:1984 ED1

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IEC 60749:1984/AMD1:1991 ED1
99.60 Withdrawal effective
Oct 28, 1996

REVISED BY

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IEC 60749:1996 ED2