IEC 60749:1984 ED1

Semiconductor devices - Mechanical and climatic test methods.

Publication date: 30 dhj 1984

General information

Current stage: 99.60 Effective date: 28 tet 1996

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Revised

PDF - 21 483 Lekë

Paper - 21 483 Lekë

CD - 21 483 Lekë

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Scope

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60147-5:1977 ED1

WITHDRAWN
IEC 60147-5A:1981 ED1

NOW

WITHDRAWN
IEC 60749:1984 ED1
99.60 Withdrawal effective
28 tet 1996

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60749:1984/AMD1:1991 ED1

WITHDRAWN
IEC 60749:1984/AMD2:1993 ED1

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2