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IEC 60747-9:1998 ED1

Semiconductor devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
20 nën 2001

General information

99.60     26 sht 2007

IEC

TC 47/SC 47E

International Standard

31.080.30  

anglisht   frëngjisht  

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Revised

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Scope

Gives product specific standards for terminology, letter symbols, essential ratings and characteristics and measuring methods for insulated-gate bipolar transistors (IGBTs).

Life cycle

NOW

WITHDRAWN
IEC 60747-9:1998 ED1
99.60 Withdrawal effective
26 sht 2007

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60747-9:1998/AMD1:2001 ED1

ABANDON
IEC 60747-9/AMD2 ED1

REVISED BY

WITHDRAWN
IEC 60747-9:2007 ED2