IEC 62215-3:2013 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

Publication date: 17 korr 2013

General information

Current stage: 60.60 Effective date: 17 korr 2013

Originator: IEC

Owner: TC 47/SC 47A

Type: International Standard

ICS: 31.200

Gjuha: anglisht frëngjisht

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Statusi: Publikuar

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Scope

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

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PUBLISHED
IEC 62215-3:2013 ED1
60.60 Standard published
17 korr 2013