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IEC 60749-30:2005/AMD1:2011 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Publication date: 25 maj 2011

General information

Current stage: 99.60 Effective date: 17 gush 2020

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

Gjuha: anglisht frëngjisht spanjisht

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Statusi: Revised

PDF - 2 261 Lekë

Paper - 2 261 Lekë

CD - 2 261 Lekë

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PREVIOUSLY

WITHDRAWN
IEC 60749-30:2005 ED1

NOW

WITHDRAWN
IEC 60749-30:2005/AMD1:2011 ED1
99.60 Withdrawal effective
17 gush 2020

REVISED BY

PUBLISHED
IEC 60749-30:2020 ED2