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IEC 60749-30:2005/AMD1:2011 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Publication date: May 25, 2011

General information

Current stage: 99.60 Effective date: Aug 17, 2020

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

Languages: English French Spanish

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Status: Revised

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IEC 60749-30:2005 ED1

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IEC 60749-30:2005/AMD1:2011 ED1
99.60 Withdrawal effective
Aug 17, 2020

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PUBLISHED
IEC 60749-30:2020 ED2