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IEC 60749-19:2003/AMD1:2010 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
28 korr 2010

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60.60     28 korr 2010

IEC

TC 47

International Standard

31.080.01  

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IEC 60749-19:2003 ED1

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PUBLISHED
IEC 60749-19:2003/AMD1:2010 ED1
60.60 Standard published
28 korr 2010