SSH EN 60749-4:2002

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 4: Nxehtësia e dobët. gjendja e qëndrueshme. prova e stresit shumë të përshpejtuar (HAST)

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publication date: 18 dhj 2006

95.99 Withdrawal of Standard 10 mar 2025

General information

Current stage: 95.99 Effective date: 10 mar 2025

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Shfuqizuar

PDF - 1 963 Lekë

Paper - 1 963 Lekë

CD - 1 963 Lekë

PDF and Paper - 3 926 Lekë

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Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

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WITHDRAWN
SSH EN 60749-4:2002
95.99 Withdrawal of Standard
10 mar 2025

SSH EN 60749-4:2002

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 4: Nxehtësia e dobët. gjendja e qëndrueshme. prova e stresit shumë të përshpejtuar (HAST)

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

95.99 Withdrawal of Standard 10 mar 2025

General information

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Scope

Life cycle

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Related project

Adopted from EN 60749-4:2002

Adopted from IEC 60749-4 Ed. 1.0 b