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SSH EN 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Dec 18, 2006
95.99 Withdrawal of Standard   Mar 10, 2025

General information

95.99     Mar 10, 2025

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-4:2002
95.99 Withdrawal of Standard
Mar 10, 2025

REVISED BY

PUBLISHED
SSH EN 60749-4:2017

Related project

Adopted from EN 60749-4:2002

Adopted from IEC 60749-4 Ed. 1.0 b