SSH EN 60749-6:2002

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 6: Magazinimi në temperaturë të lartë

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Publication date: 18 dhj 2006

95.99 Withdrawal of Standard 10 mar 2025

General information

Current stage: 95.99 Effective date: 10 mar 2025

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Shfuqizuar

PDF - 1 606 Lekë

Paper - 1 606 Lekë

CD - 1 606 Lekë

PDF and Paper - 3 212 Lekë

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Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

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SSH EN 60749-6:2002
95.99 Withdrawal of Standard
10 mar 2025

SSH EN 60749-6:2002

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 6: Magazinimi në temperaturë të lartë

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

95.99 Withdrawal of Standard 10 mar 2025

General information

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Scope

Life cycle

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Adopted from EN 60749-6:2002

Adopted from IEC 60749-6 Ed. 1.0 b