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SSH EN 60749-6:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Dec 18, 2006
95.99 Withdrawal of Standard   Mar 10, 2025

General information

95.99     Mar 10, 2025

DPS

DPS/KT 4

European Norm

31.080.01  

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Scope

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-6:2002
95.99 Withdrawal of Standard
Mar 10, 2025

REVISED BY

PUBLISHED
SSH EN 60749-6:2017

Related project

Adopted from EN 60749-6:2002

Adopted from IEC 60749-6 Ed. 1.0 b