SSH EN 60749-36:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 36: Përshpejtimi. gjendja e qëndrueshme

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Publication date: 18 dhj 2006

General information

Current stage: 60.60 Effective date: 1 jan 2006

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Publikuar

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Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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PUBLISHED
SSH EN 60749-36:2003
60.60 Standard published
1 jan 2006

SSH EN 60749-36:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 36: Përshpejtimi. gjendja e qëndrueshme

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

General information

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Scope

Life cycle

NOW

Related project

Adopted from EN 60749-36:2003

Adopted from IEC 60749-36 Ed. 1.0 b