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SSH EN 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Dec 18, 2006

General information

60.60     Jan 1, 2006

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Life cycle

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PUBLISHED
SSH EN 60749-36:2003
60.60 Standard published
Jan 1, 2006

Related project

Adopted from EN 60749-36:2003

Adopted from IEC 60749-36 Ed. 1.0 b