SSH EN 60749-17:2003

Pajisjet gjysëmpërçuese - Metodat e provës mekanike dhe klimaterike - Pjesa 17: Rrezatimi me neutron

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Publication date: 30 gush 2006

95.99 Withdrawal of Standard 10 mar 2025

General information

Current stage: 95.99 Effective date: 10 mar 2025

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

Buying

Statusi: Shfuqizuar

PDF - 1 785 Lekë

Paper - 1 785 Lekë

CD - 1 785 Lekë

PDF and Paper - 3 570 Lekë

Language

Language in which you want to receive the document.

Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-17:2003
95.99 Withdrawal of Standard
10 mar 2025

SSH EN 60749-17:2003

Pajisjet gjysëmpërçuese - Metodat e provës mekanike dhe klimaterike - Pjesa 17: Rrezatimi me neutron

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

95.99 Withdrawal of Standard 10 mar 2025

General information

Buying

Scope

Life cycle

NOW

REVISED BY

Related project

Adopted from EN 60749-17:2003

Adopted from IEC 60749-17 Ed. 1.0 b