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SSH EN 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Aug 30, 2006
95.99 Withdrawal of Standard   Mar 10, 2025

General information

95.99     Mar 10, 2025

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-17:2003
95.99 Withdrawal of Standard
Mar 10, 2025

REVISED BY

PUBLISHED
SSH EN IEC 60749-17:2019

Related project

Adopted from EN 60749-17:2003

Adopted from IEC 60749-17 Ed. 1.0 b