SSH IEC 60749-2:2002/COR1:2003
Korrigjim 1 - Pajisje gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 2: Presioni i ulët i ajrit
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
5 dhj 2011
General information
60.60
5 dhj 2011
DPS
DPS/KT 7
International Standard
31.080.01
anglisht
Scope
Modification of the validity date: now put at 2007.
Life cycle
NOW
PUBLISHED
SSH IEC 60749-2:2002/COR1:2003
60.60
Standard published
5 dhj 2011
Related project
Adopted from
IEC 60749-2 Ed. 1.0 b Cor.1