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SSH IEC 60749-2:2002/COR1:2003

Korrigjim 1 - Pajisje gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 2: Presioni i ulët i ajrit

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
5 dhj 2011

General information

60.60     5 dhj 2011

DPS

DPS/KT 7

International Standard

31.080.01  

anglisht  

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Publikuar

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Scope

Modification of the validity date: now put at 2007.

Life cycle

NOW

PUBLISHED
SSH IEC 60749-2:2002/COR1:2003
60.60 Standard published
5 dhj 2011

Related project

Adopted from IEC 60749-2:2002/COR1:2003 ED1 IDENTICAL

Adopted from IEC 60749-2 Ed. 1.0 b Cor.1