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Drejtoria e Përgjithshme e Standardizimit

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SSH IEC 60749-2:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Publication date: Dec 5, 2011

General information

Current stage: 60.60 Effective date: Dec 5, 2011

Originator: DPS

Owner: DPS/KT 7

Type: International Standard

Languages: English

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Status: Published

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Scope

Modification of the validity date: now put at 2007.

Life cycle

NOW

PUBLISHED
SSH IEC 60749-2:2002/COR1:2003
60.60 Standard published
Dec 5, 2011

Related project

Adopted from IEC 60749-2:2002/COR1:2003 ED1 IDENTICAL

Adopted from IEC 60749-2 Ed. 1.0 b Cor.1