SSH EN 62374-1:2010/AC:2011

Pajisje gjysëmpërçuese - Pjesa 1: Prova e shpimit të dielektrikut në varësi të kohës (TDDB) për shtresat metalike të jashtëme

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Publication date: 5 dhj 2011

General information

Current stage: 60.60 Effective date: 5 dhj 2011

Originator: DPS

Owner: DPS/KT 7

Type: European Norm

ICS: 31.080

Gjuha: anglisht

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Statusi: Publikuar

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PUBLISHED
SSH EN 62374-1:2010/AC:2011
60.60 Standard published
5 dhj 2011

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Adopted from EN 62374-1:2010/AC:2011

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