SSH EN 62374-1:2010/AC:2011
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Dec 5, 2011
General information
60.60
Dec 5, 2011
DPS
DPS/KT 7
European Norm
31.080
English
Life cycle
NOW
PUBLISHED
SSH EN 62374-1:2010/AC:2011
60.60
Standard published
Dec 5, 2011
Related project
Adopted from
EN 62374-1:2010/AC:2011