SSH EN 60749-3:2002

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 3: Egzaminimi vizual i jashtëm

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Publication date: 18 dhj 2006

95.99 Withdrawal of Standard 19 pri 2023

General information

Current stage: 95.99 Effective date: 19 pri 2023

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Shfuqizuar

PDF - 1 606 Lekë

Paper - 1 606 Lekë

CD - 1 606 Lekë

PDF and Paper - 3 212 Lekë

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Scope

Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-3:2002
95.99 Withdrawal of Standard
19 pri 2023

SSH EN 60749-3:2002

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 3: Egzaminimi vizual i jashtëm

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

95.99 Withdrawal of Standard 19 pri 2023

General information

Buying

Scope

Life cycle

NOW

REVISED BY

Related project

Adopted from EN 60749-3:2002

Adopted from IEC 60749-3 Ed. 1.0 b