Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 7: Matja e përmbajtjes së lagështisë së brendëshme dhe analiza e gazeve të tjerë të mbetur
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
Life cycle
NOW
WITHDRAWN SSH EN 60749-7:2002 95.99
Withdrawal of Standard 26 dhj 2014
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