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SSH EN 60749-7:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Dec 18, 2006
95.99 Withdrawal of Standard   Dec 26, 2014

General information

95.99     Dec 26, 2014

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-7:2002
95.99 Withdrawal of Standard
Dec 26, 2014

REVISED BY

PUBLISHED
SSH EN 60749-7:2011

Related project

Adopted from EN 60749-7:2002

Adopted from IEC 60749-7 Ed. 1.0 b