SSH IEC 60749-1:2002

Pajisjet gjysëmpërçuese - Metodat e provës mekanike dhe klimatike - Pjesa 1: Të përgjithshme

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Publication date: 30 sht 2011

General information

Current stage: 60.60 Effective date: 30 sht 2011

Originator: DPS

Owner: DPS/KT 7

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Publikuar

PDF - 2 915 Lekë

Paper - 2 915 Lekë

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PDF and Paper - 5 830 Lekë

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Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

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PUBLISHED
SSH IEC 60749-1:2002
60.60 Standard published
30 sht 2011

SSH IEC 60749-1:2002

Pajisjet gjysëmpërçuese - Metodat e provës mekanike dhe klimatike - Pjesa 1: Të përgjithshme

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

General information

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Scope

Life cycle

NOW

Related project

Adopted from IEC 60749-1:2002 ED1 IDENTICAL

Adopted from IEC 60749-1 Ed. 1.0 b