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SSH IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Sep 30, 2011

General information

60.60     Sep 30, 2011

DPS

DPS/KT 7

International Standard

31.080.01  

English  

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

NOW

PUBLISHED
SSH IEC 60749-1:2002
60.60 Standard published
Sep 30, 2011

Related project

Adopted from IEC 60749-1:2002 ED1 IDENTICAL

Adopted from IEC 60749-1 Ed. 1.0 b