SSH EN 60749-5:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 5: Prova e jetëgjatësisë në ndikimin e temperaturës dhe lagështisë

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Publication date: 18 dhj 2006

95.99 Withdrawal of Standard 19 pri 2023

General information

Current stage: 95.99 Effective date: 19 pri 2023

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Shfuqizuar

PDF - 1 963 Lekë

Paper - 1 963 Lekë

CD - 1 963 Lekë

PDF and Paper - 3 926 Lekë

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Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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WITHDRAWN
SSH EN 60749-5:2003
95.99 Withdrawal of Standard
19 pri 2023

SSH EN 60749-5:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 5: Prova e jetëgjatësisë në ndikimin e temperaturës dhe lagështisë

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

95.99 Withdrawal of Standard 19 pri 2023

General information

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Scope

Life cycle

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REVISED BY

Related project

Adopted from EN 60749-5:2003

Adopted from IEC 60749-5 Ed. 1.0 b