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SSH EN 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Dec 18, 2006
95.99 Withdrawal of Standard   Apr 19, 2023

General information

95.99     Apr 19, 2023

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-5:2003
95.99 Withdrawal of Standard
Apr 19, 2023

REVISED BY

PUBLISHED
SSH EN 60749-5:2017

Related project

Adopted from EN 60749-5:2003

Adopted from IEC 60749-5 Ed. 1.0 b