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SSH EN 62374:2007

Pajisjet gjysëmpërçuese — Prova e ndërprerjeve dielektrike në funksion të kohës (TDDB) për fletët dielektrike të rrjetit

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
16 tet 2008

General information

60.60     1 jan 2008

DPS

DPS/KT 7

European Norm

31.080  

anglisht  

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Scope

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

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PUBLISHED
SSH EN 62374:2007
60.60 Standard published
1 jan 2008

Related project

Adopted from EN 62374:2007

Adopted from IEC 62374 Ed. 1.0 b