SSH EN 62373:2006
Prova e qëndrueshmërisë së temperaturës së polarizimit për transistorët me efekt fushe, me gjysëmpërçues prej oksid metalesh (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
16 tet 2008
General information
60.60
1 jan 2008
DPS
DPS/KT 7
European Norm
31.080
anglisht
Scope
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Life cycle
NOW
PUBLISHED
SSH EN 62373:2006
60.60
Standard published
1 jan 2008
Related project
Adopted from
EN 62373:2006
Adopted from
IEC 62373 Ed. 1.0 b