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Drejtoria e Përgjithshme e Standardizimit

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SSH EN 62373:2006

Prova e qëndrueshmërisë së temperaturës së polarizimit për transistorët me efekt fushe, me gjysëmpërçues prej oksid metalesh (MOSFET)

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Publication date: 16 tet 2008

General information

Current stage: 60.60 Effective date: 1 jan 2008

Originator: DPS

Owner: DPS/KT 7

Type: European Norm

Gjuha: anglisht

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Statusi: Publikuar

PDF - 2 677 Lekë

Paper - 2 677 Lekë

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PDF and Paper - 5 354 Lekë

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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NOW

PUBLISHED
SSH EN 62373:2006
60.60 Standard published
1 jan 2008

Related project

Adopted from EN 62373:2006

Adopted from IEC 62373 Ed. 1.0 b