SSH EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Publication date: Oct 16, 2008

General information

Current stage: 60.60 Effective date: Jan 1, 2008

Originator: DPS

Owner: DPS/KT 7

Type: European Norm

ICS: 31.080

Languages: English

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Status: Published

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Life cycle

NOW

PUBLISHED
SSH EN 62373:2006
60.60 Standard published
Jan 1, 2008

Related project

Adopted from EN 62373:2006

Adopted from IEC 62373 Ed. 1.0 b

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