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SSH EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Oct 16, 2008

General information

60.60     Jan 1, 2008

DPS

DPS/KT 7

European Norm

31.080  

English  

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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PUBLISHED
SSH EN 62373:2006
60.60 Standard published
Jan 1, 2008

Related project

Adopted from EN 62373:2006

Adopted from IEC 62373 Ed. 1.0 b