Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.
WITHDRAWN
SSH EN 62276:2005
95.99
Withdrawal of Standard
16 dhj 2015
WITHDRAWN
SSH EN 62276:2013