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SSH EN 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods

Aug 14, 2008
95.99 Withdrawal of Standard   Dec 16, 2015

General information

95.99     Dec 16, 2015

DPS

DPS/KT 7

European Norm

31.140  

English  

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Scope

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Life cycle

NOW

WITHDRAWN
SSH EN 62276:2005
95.99 Withdrawal of Standard
Dec 16, 2015

REVISED BY

WITHDRAWN
SSH EN 62276:2013

Related project

Adopted from EN 62276:2005

Adopted from IEC 62276 Ed. 1.0 en