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SSH EN 62276:2013

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

May 13, 2014
95.99 Withdrawal of Standard   Feb 18, 2020

General information

95.99     Feb 18, 2020

DPS

DPS/KT 7

European Norm

31.140  

English  

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Scope

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.

Life cycle

PREVIOUSLY

WITHDRAWN
SSH EN 62276:2005

NOW

WITHDRAWN
SSH EN 62276:2013
95.99 Withdrawal of Standard
Feb 18, 2020

REVISED BY

PUBLISHED
SSH EN 62276:2016

Related project

Adopted from EN 62276:2013