SSH EN 60749-35:2006

Pajisjet gjysmëpërçuese — Metodat e provës klimatike dhe mekanike — Pjesa 35: Mikroskopia akustike për komponentët elektronik plastikë të hermetizuar

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Publication date: 6 qer 2008

General information

Current stage: 60.60 Effective date: 1 jan 2008

Originator: DPS

Owner: DPS/KT 7

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

Buying

Statusi: Publikuar

PDF - 3 570 Lekë

Paper - 3 570 Lekë

CD - 3 570 Lekë

PDF and Paper - 7 140 Lekë

Language

Language in which you want to receive the document.

Scope

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

Life cycle

NOW

PUBLISHED
SSH EN 60749-35:2006
60.60 Standard published
1 jan 2008

SSH EN 60749-35:2006

Pajisjet gjysmëpërçuese — Metodat e provës klimatike dhe mekanike — Pjesa 35: Mikroskopia akustike për komponentët elektronik plastikë të hermetizuar

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

General information

Buying

Scope

Life cycle

NOW

Related project

Adopted from EN 60749-35:2006

Adopted from IEC 60749-35 Ed. 1.0 b