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SSH EN 60749-35:2006

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Jun 6, 2008

General information

60.60     Jan 1, 2008

DPS

DPS/KT 7

European Norm

31.080.01  

English  

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Scope

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

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PUBLISHED
SSH EN 60749-35:2006
60.60 Standard published
Jan 1, 2008

Related project

Adopted from EN 60749-35:2006

Adopted from IEC 60749-35 Ed. 1.0 b