Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 24: Rezistenca ndaj lagështisë së përshpejtuar - Prova e stresit shumë të përforcuar HAST të papolarizuar
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Life cycle
NOW
PUBLISHED SSH EN 60749-24:2004 60.60
Standard published 1 jan 2006
Related project
Adopted from
EN 60749-24:2004
Adopted from
IEC 60749-24 Ed. 1.0 b
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