DPS
Drejtoria e Përgjithshme e Standardizimit
0 Items
My account
E-albania
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

SSH EN 60749-24:2004

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

Aug 30, 2006

General information

60.60     Jan 1, 2006

DPS

DPS/KT 4

European Norm

31.080  

English  

Buying

Published

Language in which you want to receive the document.

Scope

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Life cycle

NOW

PUBLISHED
SSH EN 60749-24:2004
60.60 Standard published
Jan 1, 2006

Related project

Adopted from EN 60749-24:2004

Adopted from IEC 60749-24 Ed. 1.0 b