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Drejtoria e Përgjithshme e Standardizimit

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SSH EN 60749-8:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 8: Vulosja

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Publication date: 18 dhj 2006

General information

Current stage: 60.60 Effective date: 1 jan 2006

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

Gjuha: anglisht

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Statusi: Publikuar

PDF - 2 915 Lekë

Paper - 2 915 Lekë

CD - 2 915 Lekë

PDF and Paper - 5 830 Lekë

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Life cycle

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PUBLISHED
SSH EN 60749-8:2003
60.60 Standard published
1 jan 2006

Related project

Adopted from EN 60749-8:2003

Adopted from IEC 60749-8 Ed. 1.0 b