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SSH EN 60749-8:2003

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Dec 18, 2006

General information

60.60     Jan 1, 2006

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Life cycle

NOW

PUBLISHED
SSH EN 60749-8:2003
60.60 Standard published
Jan 1, 2006

Related project

Adopted from EN 60749-8:2003

Adopted from IEC 60749-8 Ed. 1.0 b