SSH EN 60749-23:2004

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 23: Jetëgjatësia gjatë punës në temperaturë të lartë

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Publication date: 14 gush 2008

General information

Current stage: 60.60 Effective date: 1 jan 2006

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Publikuar

PDF - 2 261 Lekë

Paper - 2 261 Lekë

CD - 2 261 Lekë

PDF and Paper - 4 522 Lekë

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Scope

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

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PUBLISHED
SSH EN 60749-23:2004
60.60 Standard published
1 jan 2006

SSH EN 60749-23:2004

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 23: Jetëgjatësia gjatë punës në temperaturë të lartë

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

General information

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Scope

Life cycle

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Related project

Adopted from EN 60749-23:2004

Adopted from IEC 60749-23 Ed. 1.0 b