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SSH EN 60749-23:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Aug 14, 2008

General information

60.60     Jan 1, 2006

DPS

DPS/KT 4

European Norm

31.080.01  

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Scope

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Life cycle

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PUBLISHED
SSH EN 60749-23:2004
60.60 Standard published
Jan 1, 2006

Related project

Adopted from EN 60749-23:2004

Adopted from IEC 60749-23 Ed. 1.0 b