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Automatic electrical controls - Part 2-8: Particular requirements for electrically operated water valves, including mechanical requirements
40.60 Close of voting
Automatic electrical controls - Part 2-9: Particular requirements for temperature sensing controls
40.99 Full report circulated: DIS approved for registration as FDIS
Medical electrical equipment - Dosimeters with ionization chambers or solid-state detectors as used in radiotherapy
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-1: Blank detail specification - Current limiting application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-2: Blank detail specification - Heating element application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ
20.99 WD approved for registration as CD
Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
30.60 Close of voting/ comment period
Semiconductor devices - Part 16-11: Microwave integrated circuits - Power detectors
40.60 Close of voting
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
40.60 Close of voting
Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
30.99 CD approved for registration as DIS
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
20.99 WD approved for registration as CD
Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - wire bond pull test methods
40.00 DIS registered
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
40.00 DIS registered
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
40.20 DIS ballot initiated: 12 weeks
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