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ISO/TR 21477:2017

Optics and photonics — Preparation of drawings for optical elements and systems — Surface imperfection specification and measurement systems

Aug 16, 2017

General information

60.60     Aug 16, 2017

ISO

ISO/TC 172/SC 1

Technical Report

37.020  

English  

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Scope

ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.

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ISO/TR 21477:2017
60.60 Standard published
Aug 16, 2017

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