IEC 62276:2012 ED2

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Publication date: Oct 19, 2012

General information

Current stage: 99.60 Effective date: Oct 24, 2016

Originator: IEC

Owner: TC 49

Type: International Standard

ICS: 31.140

Languages: English French

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Status: Revised

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Scope

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 62276:2005 ED1

NOW

WITHDRAWN
IEC 62276:2012 ED2
99.60 Withdrawal effective
Oct 24, 2016

REVISED BY

PUBLISHED
IEC 62276:2016 ED3