IEC 62276:2005 ED1

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Publication date: May 30, 2005

General information

Current stage: 99.60 Effective date: Oct 19, 2012

Originator: IEC

Owner: TC 49

Type: International Standard

ICS: 31.140

Languages: English

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Status: Revised

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Scope

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62276:2001 ED1

NOW

WITHDRAWN
IEC 62276:2005 ED1
99.60 Withdrawal effective
Oct 19, 2012

REVISED BY

WITHDRAWN
IEC 62276:2012 ED2